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Study of the X-ray microbeam for scanning microscopes

✍ Scribed by Y. Iketaki; Y. Horikawa; S. Mochimaru; K. Nagai; T. Kiyokura; M. Oshima; A. Yagishita


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
306 KB
Volume
80
Category
Article
ISSN
0368-2048

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## Abstract The investigation of structure gradients in polymer fibers or pipes by the X‐ray microbeam scanning technique is put on its theoretical fundament. The inverse Abel transform desmears measured data in X‐ray scattering fiber computer‐tomography (XSF‐CT). Fast, low noise algorithms from on