𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Scanning Microbeam X-Ray Scattering of Fibers Analyzed by One-Dimensional Tomography

✍ Scribed by Norbert Stribeck; Ulrich Nöchel; Armando Almendárez Camarillo


Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
339 KB
Volume
209
Category
Article
ISSN
1022-1352

No coin nor oath required. For personal study only.

✦ Synopsis


Abstract

The investigation of structure gradients in polymer fibers or pipes by the X‐ray microbeam scanning technique is put on its theoretical fundament. The inverse Abel transform desmears measured data in X‐ray scattering fiber computer‐tomography (XSF‐CT). Fast, low noise algorithms from one‐dimensional tomography are available. They are applicable to scan data in which the X‐ray absorption, the small‐angle X‐ray scattering (SAXS), or the wide‐angle X‐ray diffraction (WAXD) is measured. The method is demonstrated by application to SAXS scan data from a polymer fiber. The resulting sequence of image‐space SAXS patterns is reflecting the nanostructure variation along the fiber radius.

magnified image


📜 SIMILAR VOLUMES


Study of the structure development durin
✍ Joshua M. Samon; Jerold M. Schultz; Jing Wu; Benjamin Hsiao; Fengji Yeh; Rainer 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 267 KB 👁 2 views

The melt spinning of nylon 6 has been studied with on-line wide-angle synchrotron X-ray scattering techniques. The apparatus consisted of a single screw extruder and a metering pump mounted on a horizontal platform that could be translated in the vertical direction allowing a range of distances to b

On the origin of the multiple melting be
✍ Z. Denchev; A. Nogales; T. A. Ezquerra; J. Fernandes-Nascimento; F. J. Baltà-Cal 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 270 KB 👁 2 views

In this article a study on the melting behavior and microstructure of semicrystalline poly(ethylene naphthalene-2,6-dicarboxylate) (PEN) prepared by crystallization from the glass under different annealing conditions is presented. The influence of the annealing temperature (T a ), annealing time (t