𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Study of the structure of interpenetrating polymer systems using the turbidity spectrum and X-ray diffractometry

✍ Scribed by V.I. Klenin; M.Yu. Prozorova; L.S. Andrianova; Yu.V. Brestkin; G.P. Belonovskaya; S.Ya. Frenkel

Book ID
118965416
Publisher
Elsevier Science
Year
1977
Weight
621 KB
Volume
19
Category
Article
ISSN
0032-3950

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Dynamical X-ray diffractometry of the de
Dynamical X-ray diffractometry of the defect structure of garnet crystals
✍ Pylypiv, V. M. ;Vladimirova, T. P. ;Fodchuk, I. M. ;Ostafiychuk, B. K. ;Kyslovsk πŸ“‚ Article πŸ“… 2011 πŸ› John Wiley and Sons 🌐 English βš– 338 KB

## Abstract The generalized statistical dynamical theory of X‐ray diffraction by imperfect single crystals is applied for the structural characterization of real single crystals with complex basis, namely, gadolinium gallium garnet (GGG) crystal Gd~3~Ga~5~O~12~. The developed theoretical approach t

Study of the dielectric constant of poly
Study of the dielectric constant of polyurethane/polybutyl-methacrylate interpenetrating polymer networks using metal–insulator–semiconductor structure
✍ X. M. Qian; D. Q. Qin; J. Y. Wang; J. Tang; F. Li; Y. B. Bai; T. J. Li; X. Y. Ta πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 136 KB πŸ‘ 2 views

Polyurethane/polybutyl-methacrylate interpenetrating polymer networks (IPNs) film was formed on n-Si substrate by the dropping technique. When aluminum (Al) was vacuum deposited on the top of the film, the Al/IPNs/n-Si (metal-insulatorsemiconductor) structure was fabricated successfully. With the ai