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Study of the electrical, structural and surface morphological characteristics of Pt/Re/Au ohmic contacts on p-type GaN

✍ Scribed by V. Rajagopal Reddy

Book ID: 113781384
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 454 KB
Volume: 93
Category: Article
ISSN: 0254-0584
DOI: 10.1016/j.matchemphys.2005.03.062

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## Abstract We have investigated the electrical and structural properties of Pt/Ti metallization scheme on n‐type InP as a function of annealing temperature using current–voltage (__I__–__V__), capacitance–voltage (__C__–__V__), Auger electron spectroscopy (AES), and X‐ray diffraction (XRD) measure