Study of silicon carbide for X-ray detection and spectroscopy
โ Scribed by Bertuccio, G.; Casiraghi, R.
- Book ID
- 120520151
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 661 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0018-9499
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๐ SIMILAR VOLUMES
The structural changes which occur when single crystals of a silicon carbide (6H) are heated in vacua, have been studied by using X-ray diffraction methods. The crystals were heated in an induction furnace for an hour to N 2280ยฐC. This resulted in the formation of pseudomorphs which retained the mor
## Abstract Xโray photoelectron spectroscopy (XPS) and Bremsstrahlungโexcited Auger electron spectroscopy (XAES) were used to study the surface composition and oxidation of silicon carbide platelets which had been heated in air at 500โ800ยฐ C. The surface oxide thickness for each heating time and te