Silicon carbide (Sic) was chemical vapor deposited (CVD) onto a carbon fiber to investigate oxidation protection of the coating. This thin film of Sic was analyzed before and after argon and oxygen ion beam etching with core and valence band X-ray Photoelectron Spectroscopy (XPS). The valence band o
โฆ LIBER โฆ
X-Ray study of silicon carbide fibers
โ Scribed by G. P. Grinevich; N. I. Zakharenko; V. S. Kopan'; P. M. Silenko
- Publisher
- Springer
- Year
- 1990
- Tongue
- English
- Weight
- 325 KB
- Volume
- 29
- Category
- Article
- ISSN
- 1573-9066
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