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Study of leakage defects on GaN films by conductive atomic force microscopy

✍ Scribed by Moore, J C; Ortiz, J E; Xie, J; Morkoç, H; Baski, A A


Book ID
125467070
Publisher
Institute of Physics
Year
2007
Tongue
English
Weight
319 KB
Volume
61
Category
Article
ISSN
1742-6588

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