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Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy

✍ Scribed by Li, Chun; Bando, Yoshio; Golberg, Dmitri


Book ID
121226293
Publisher
American Chemical Society
Year
2010
Tongue
English
Weight
399 KB
Volume
4
Category
Article
ISSN
1936-0851

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