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Study of indium tin oxide thin film for separative extended gate ISFET

✍ Scribed by Li-Te Yin; Jung-Chuan Chou; Wen-Yaw Chung; Tai-Ping Sun; Shen-Kan Hsiung

Book ID: 114192526
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 170 KB
Volume: 70
Category: Article
ISSN: 0254-0584
DOI: 10.1016/s0254-0584(00)00373-4

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