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Study of hot carrier degradation in dram cells combining random telegraph signal and charge pumping measurements

✍ Scribed by S Pierunek; D Pogany; J.L Autran; B Leroy

Book ID: 117149546
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 651 KB
Volume: 245
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(98)00871-0

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