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Study of charge carrier quantization in strained Si-nMOSFETs

✍ Scribed by C.D. Nguyen; A.T. Pham; C. Jungemann; B. Meinerzhagen

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 267 KB
Volume: 8
Category: Article
ISSN: 1369-8001
DOI: 10.1016/j.mssp.2004.09.055

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