๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Study of a Novel Electronics Circuit for Detecting Faults in the IGBT

โœ Scribed by Rodriguez Blanco, Marco Antonio; Vazquez Perez, Amsi; Hernandez Gonzalez, Leobardo; Golikov, Victor; Aguayo Alquicira, Jesus; May Alarcon, Manuel

Book ID
125542435
Publisher
IEEE
Year
2014
Tongue
Portuguese
Weight
927 KB
Volume
12
Category
Article
ISSN
1548-0992

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Design of a novel fault-tolerant voter c
Design of a novel fault-tolerant voter circuit for TMR implementation to improve reliability in digital circuits
โœ R.V. Kshirsagar; R.M. Patrikar ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 386 KB

Due to the shrinking of feature size and significant reduction in noise margins, nanoscale circuits have become more susceptible to manufacturing defects, interference from radiation and noise-related transient faults. Many of these faults are not permanent in nature but their occurrence can result