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[IEEE 2011 IEEE Applied Power Electronics Conference and Exposition - APEC 2011 - Fort Worth, TX, USA (2011.03.6-2011.03.11)] 2011 Twenty-Sixth Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - A novel fault detection circuit for short-circuit faults of IGBT

✍ Scribed by Kim, Min-Sub; Park, Byoung-Gun; Kim, Rae-Young; Hyun, Dong-Seok

Book ID: 115439494
Publisher: IEEE
Year: 2011
Weight: 589 KB
Volume: 0
Category: Article
ISBN: 1424480841
DOI: 10.1109/apec.2011.5744621

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