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Studies of the performance of OPAL single-sided FOXFET detectors in a test beam

✍ Scribed by Michael Yurko

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
209 KB
Volume
348
Category
Article
ISSN
0168-9002

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During the past years, the DEPFET collaboration undertook an extensive program of beam test studies as a part of the development of new generations of DEPFET pixel detectors. The beam tests in 2006, 2007 and 2008 on the CERN SPS beam have demonstrated high performance of ILC-type DEPFET matrices: S/