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The first beam test of a monolithic particle pixel detector in high-voltage CMOS technology

✍ Scribed by I. Perić; C. Takacs; J. Behr; F.M. Wagner; P. Fischer

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 470 KB
Volume: 628
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2010.06.337

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