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A novel monolithic pixelated particle detector implemented in high-voltage CMOS technology

✍ Scribed by Ivan Perić

Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
247 KB
Volume
582
Category
Article
ISSN
0168-9002

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✦ Synopsis

A new concept for monolithic pixel detector with 100% fill-factor is presented. The detection is based on the charge collection in the depleted zone of the reverse biased diode. Complex pixel electronics, including charge sensitive amplifier, amplitude discriminator and digital storage element is placed completely inside the diode cathode (N-well). A test chip that comprises a small pixel matrix and test structures has been fabricated in a 0:35 mm high-voltage CMOS process and successfully tested. The results of the electrical tests and measurements with X-ray and beta radioactive sources are presented.

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Large monolithic particle pixel-detector
Large monolithic particle pixel-detector in high-voltage CMOS technology
✍ I. Perić; C. Takacs 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 563 KB

A large monolithic particle pixel-detector implemented as system on a chip in a high-voltage 0:35 mm CMOS technology will be presented. The detector uses high-voltage n-well/p-substrate diodes as pixelsensors. The diodes can be reversely biased with more than 60 V. In this way, depleted zones of abo