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Studies of the interactions between (311) defects and type I and II dislocation loops in Si+ implanted silicon

✍ Scribed by K.S. Jones; J. Liu; L. Zhang; V. Krishnamoorthy; R.T. DeHoff

Book ID
113286821
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
425 KB
Volume
106
Category
Article
ISSN
0168-583X

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