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Studies of microhardness and mar resistance using a scanning probe microscope

✍ Scribed by Frank N Jones; Weidian Shen; Stanley M Smith; Zhihua Huang; Rose A Ryntz


Book ID
114215580
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
531 KB
Volume
34
Category
Article
ISSN
0033-0655

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A new type of scanning probe microscope:
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We present a new application of the quantum Hall effect (QHE): a combined technique of an electrometer and a THz microscope. In this system, we exploit the QHE devices as a voltage sensor and a THz detector. Using this technique, we simultaneously mapped out longitudinal voltage and cyclotron emissi