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A new type of scanning probe microscope: combination between an electrometer and a THz microscope

✍ Scribed by Y. Kawano; T. Okamoto


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
192 KB
Volume
36
Category
Article
ISSN
0026-2692

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✦ Synopsis


We present a new application of the quantum Hall effect (QHE): a combined technique of an electrometer and a THz microscope. In this system, we exploit the QHE devices as a voltage sensor and a THz detector. Using this technique, we simultaneously mapped out longitudinal voltage and cyclotron emission in a quantized Hall bar. This measurement enabled us to separately image spatial distributions of intra-and inter-Landau-level scattering in the QHE systems.