The only member of the IIΒ±III 2 Β±VI 4 semiconductor family with layered structure is ZnIn 2 S 4 . At ambient conditions several polytypes of this compound have been reported. Energy dispersive X-ray diffraction of ZnIn 2 S 4 has been realized at high pressure up to 18 GPa. The structure of this poly
Structure factor of liquid CCl4 under high pressure
β Scribed by P. Bhattarai; M.D. Zeidler; P. Chieux
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 405 KB
- Volume
- 174
- Category
- Article
- ISSN
- 0921-4526
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β¦ Synopsis
Neutron diffraction studies on liquid carbon tetrachloride have been carried out under pressures of 1.0 bar and 3.5 kbar. The pressure effect on the liquid structure results in a shift of the three peaks of the corrected coherent differential scattering cross-section, two towards higher x-values and one towards a lower K-value.
π SIMILAR VOLUMES
Neutrondiffraction studies have been made for liquid CCL, m a porous silica (Spherisorb S2OW) with a pore size of z 90 A diameter. The resulting intensity pattern exhibits the expected "diffraction broadening" of the main peak but also shows an apparent change in the local uttermolecular correlation
We have performed band structure calculations of high pressure phases of phosphorus within the local-density-functional formalism and the norm-conserving pseudopotential method. The structural stability of the simple hexagonal phase of phosphorus has been studied, and the calculated transition press