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Structure and impedance spectroscopy of Pr1−xSrxFe0.8Co0.2O3−δ(x=0.1, 0.2, 0.3) thin films grown by laser ablation

✍ Scribed by I. Ruiz de Larramendi; R. López-Antón; J. I. Ruiz de Larramendi; T. Rojo


Book ID
106021208
Publisher
Springer
Year
2008
Tongue
English
Weight
893 KB
Volume
93
Category
Article
ISSN
1432-0630

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Epitaxial La 0.6 Sr 0.4 Co 0.2 Fe 0.8 O 3Àd (LSCF) thin films have been grown successfully on single crystal LaAlO 3 substrate by pulsed laser deposition (PLD). AFM micrographs have shown a rms roughness of 5 A for the 550 C deposited films. The films further exhibited electrical conductivities of a