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Structure and electrical conductivity of polycrystalline silicon films grown by molecularbeam deposition accompanied by low-energy ion bombardment of the growth surface

โœ Scribed by D. A. Pavlov; A. F. Khokhlov; D. V. Shungurov; V. G. Shengurov


Book ID
110119683
Publisher
Springer
Year
1997
Tongue
English
Weight
290 KB
Volume
31
Category
Article
ISSN
1063-7826

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