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Structurally relaxed models of the Si(001)–SiO2 interface

✍ Scribed by Pasquarello, Alfredo; Hybertsen, Mark S.; Car, Roberto

Book ID: 121647099
Publisher: American Institute of Physics
Year: 1996
Tongue: English
Weight: 241 KB
Volume: 68
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.116489

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