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Structural studies of ITO films using grazing incidence x-ray diffractometry

โœ Scribed by M. Quaas; H. Wulff

Book ID
105897302
Publisher
Springer
Year
1998
Tongue
English
Weight
67 KB
Volume
361
Category
Article
ISSN
1618-2650

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Characterization of in-plane structures
Characterization of in-plane structures of vapor deposited thin-films of distyryl-oligothiophenes by grazing incidence x-ray diffractometry
โœ Noriyuki Yoshimoto; Keijyu Aosawa; Toshinori Taniswa; Kazuhiko Omote; J. Ackerma ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 518 KB

## Abstract The inโ€plane structures of vapor deposited ultrathin films of distyrylโ€oligothiophenes (DSโ€2T) on SiO~2~ substrate were characterized by grazing incidence xโ€ray diffractometry (GIXD). Two polymorphs, lowโ€temperature and highโ€temperature phases, were identified, and the two dimensional u