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Structural properties of titanium dioxide films grown on p-Si by metal-organic chemical vapor deposition at low temperature

✍ Scribed by Y.S. Yoon; W.N. Kang; S.S. Yom; T.W. Kim; M. Jung; T.H. Park; K.Y. Seo; Jong Yong Lee


Book ID
107864598
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
492 KB
Volume
238
Category
Article
ISSN
0040-6090

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