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Structural properties of Ge-implanted SiO2 layers and related MOS memory effects

โœ Scribed by S. Duguay; A. Slaoui; J.J. Grob; M. Kanoun; S. Burignat; A. Souifi


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
449 KB
Volume
124-125
Category
Article
ISSN
0921-5107

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