The effect of the thickness of the copper layers on the microstructure and magnetoresistance of electrodeposited Co/Cu multilayers was investigated by using the combination of wide-angle and small-angle X-ray scattering, transmission electron microscopy with high resolution and magnetoresistance mea
Structural properties of electrodeposited Co/Cu multilayers
✍ Scribed by H. El Fanity; K. Rahmouni; M. Bouanani; A. Dinia; G. Shmerber; C. Mény; P. Panissod; A. Cziraki; F. Cherkaoui; A. Berrada
- Book ID
- 108389337
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 314 KB
- Volume
- 318
- Category
- Article
- ISSN
- 0040-6090
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