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Structural properties of amorphous SiC films and x-ray membranes by EXAFS

โœ Scribed by A.M. Haghiri-Gosnet; F. Rousseaux; E. Gat; J. Durand; A.M. Flank


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
317 KB
Volume
17
Category
Article
ISSN
0167-9317

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โœ K.D. Machado; A.S. Dubiel; E. Deflon; I.M. Kostrzepa; S.F. Stolf; D.F. Sanchez; ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 474 KB

The local atomic order of amorphous Se 1-x S x alloys, x = 0.20, 0.30, produced by mechanical alloying were studied by Raman scattering, X-ray diffraction, EXAFS and reverse Monte Carlo simulations of their total structure factors and EXAFS oscillations on Se K edge. The results obtained were compar