✦ LIBER ✦

Structural investigation of nitrided c-sapphire substrate by grazing incidence x-ray diffraction and transmission electron microscopy

✍ Scribed by Lee, Hyo-Jong; Ha, Jun-Seok; Lee, S. W.; Lee, H. J.; Goto, H.; Lee, S. H.; Cho, M. W.; Yao, T.; Minegishi, T.; Hanada, T.; Hong, Soon-Ku; Sakata, Osami; Lee, Jae Wook; Lee, Jeong Yong

Book ID: 120014878
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 661 KB
Volume: 91
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2815919

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Structural Investigation of Hydrous TiO

Structural Investigation of Hydrous TiO 2 Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy

✍ Jalava, Juho-Pertti; Heikkilä, Lauri; Hovi, Oskari; Laiho, Reino; Hiltunen, Erkk 📂 Article 📅 1998 🏛 American Chemical Society 🌐 English ⚖ 175 KB

Defect structure study of epitaxial InN

Defect structure study of epitaxial InN films by transmission electron microscopy and X-ray diffraction

✍ Wei-Li Chen; Yan-Hsin Wang; Ming-Fei Chen; Man-Fang Huang; Jenn-Chyuan Fan 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 530 KB

Structural and electrical properties of

Structural and electrical properties of ZnSe laser diodes optimized by transmission electron microscopy, reflection high energy electron diffraction, X-ray diffraction and C-V profiling

✍ T. Behr; D. Hommel; H. Cerva; J. Nürnberger; V. Beyersdorfer; G. Landwehr 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 596 KB

Investigation of the structure of nanocr

Investigation of the structure of nanocrystalline refractory oxides by X-ray diffraction, electron microscopy, and atomic force microscopy

✍ T. M. Ulyanova; L. V. Titova; S. V. Medichenko; Yu. G. Zonov; T. E. Konstantinov 📂 Article 📅 2006 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 287 KB

Structural characterization of “as-depos

Structural characterization of “as-deposited” cesium iodide films studied by X-ray diffraction and transmission electron microscopy techniques

✍ Triloki, ; Garg, P.; Rai, R.; Singh, B.K. 📂 Article 📅 2014 🏛 Elsevier Science 🌐 English ⚖ 956 KB

Lattice relaxation of ZnS grown on GaP i

Lattice relaxation of ZnS grown on GaP investigated by high-resolution X-ray diffraction and transmission electron microscopy

✍ Kunio Ichino; Akinori Nishigaki; Akiyoshi Yamauchi 📂 Article 📅 2012 🏛 John Wiley and Sons 🌐 English ⚖ 319 KB