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Defect structure study of epitaxial InN films by transmission electron microscopy and X-ray diffraction

✍ Scribed by Wei-Li Chen; Yan-Hsin Wang; Ming-Fei Chen; Man-Fang Huang; Jenn-Chyuan Fan

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
530 KB
Volume
42
Category
Article
ISSN
1386-9477

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