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Structural determination of silicides in Ti 5331S

✍ Scribed by A.P. Woodfield; M.H. Loretto


Book ID
116062824
Publisher
Elsevier Science
Year
1987
Weight
290 KB
Volume
21
Category
Article
ISSN
0036-9748

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The structural evolution in fiber-textured Ti / Si thin films was investigated by in-situ X-ray diffraction in the temperature range preceding the formation of silicide compounds. Abnormal thermal behaviour of both 002 and 101 diffraction profiles was observed at 360 and 450 8C, which could be under