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Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy

✍ Scribed by De Crescenzi, M.; Lozzi, L.; Picozzi, P.; Santucci, S.; Benfatto, M.; Natoli, C. R.

Book ID
125482353
Publisher
The American Physical Society
Year
1989
Tongue
English
Weight
722 KB
Volume
39
Category
Article
ISSN
1098-0121

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## Abstract The lattice parameters of chromium clusters deposited on carbon substrates were determined by extended energy‐loss fine structure (EXELFS) measurements in transmission mode beyond the L~2, 3~ edges of chromium using an electron microscope. Fourier analysis of the data shows a sizeable l