Structural characterization of supported
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L. Lozzi; M. Passacantando; P. Picozzi; S. Santucci; M. Diociaiuti; L. Paoletti
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Article
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1990
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John Wiley and Sons
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English
β 262 KB
## Abstract The lattice parameters of chromium clusters deposited on carbon substrates were determined by extended energyβloss fine structure (EXELFS) measurements in transmission mode beyond the L~2, 3~ edges of chromium using an electron microscope. Fourier analysis of the data shows a sizeable l