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Application of extended energy loss fine structure in determining the structure of amorphous SiO2

โœ Scribed by Y. Ito; D. Winkler; H. Jain; D.B. Williams


Book ID
117148661
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
743 KB
Volume
222
Category
Article
ISSN
0022-3093

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