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Structural characterization of Ti and Pt thin films on GaAs(100) substrate

✍ Scribed by X. Wu; E. S. Yang; N. D. Theodore

Book ID: 112811936
Publisher: Springer US
Year: 1990
Tongue: English
Weight: 509 KB
Volume: 19
Category: Article
ISSN: 0361-5235
DOI: 10.1007/bf02651391

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