Characterization of Single-Crystalline Aluminum Thin Film on (100) GaAs Substrate

✍ Scribed by Lin, Shi-Wei; Wu, Jau-Yang; Lin, Sheng-Di; Lo, Ming-Cheng; Lin, Ming-Huei; Liang, Chi-Te

• Book ID: 121448256
• Publisher: Institute of Pure and Applied Physics
• Year: 2013
• Tongue: English
• Weight: 657 KB
• Volume: 52
• Category: Article
• ISSN: 0021-4922
• DOI: 10.7567/JJAP.52.045801