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Structural characterization of thin films formed or changed on materials by micro Raman spectroscopy

✍ Scribed by K. Witke; Klaus-Werner Brzezinka; Peter Reich

Publisher: Springer
Year: 1998
Tongue: English
Weight: 75 KB
Volume: 361
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s002160050969

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