Structural characterization of self-assembled Ge dot multilayers by X-ray diffraction and reflectivity methods

✍ Scribed by A.A Darhuber; V Holy; P Schittenhelm; J Stangl; I Kegel; Z Kovats; T.H Metzger; G Bauer; G Abstreiter; G Grübel

• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 141 KB
• Volume: 2
• Category: Article
• ISSN: 1386-9477
• DOI: 10.1016/s1386-9477(98)00161-1