Coverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffraction

✍ Scribed by M. Pomerantz; A. Segmüller; L. Netzer; J. Sagiv

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 723 KB
• Volume: 132
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(85)90466-3