𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Structural characterization of nickel–titanium film on silicon carbide

✍ Scribed by Petr Macháč; Bohumil Barda; Jaroslav Maixner

Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
170 KB
Volume
254
Category
Article
ISSN
0169-4332

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of silicon carbide thin
Characterization of silicon carbide thin films grown on Si and SiO2/Si substrates
✍ P. Zanola; E. Bontempi; C. Ricciardi; G. Barucca; L.E. Depero 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 227 KB

Due to its outstanding electrical and mechanical properties, silicon carbide (SiC) is considered a leading semiconducting material for high temperature sensors. Since the piezoresistive effect in SiC is highly anisotropic and exhibits a dependence on the crystal orientation, the role of the substra