✦ LIBER ✦

Structural and physical properties of Co films DC-bias-plasma-sputter-deposited on MgO(001)

✍ Scribed by Hong Qiu; Tatsuya Ohbuchi; Hisashi Nakai; Mituru Hashimoto

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 307 KB
Volume: 92
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(95)00200-6

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Epitaxial growth, structure and properti

Epitaxial growth, structure and properties of Ni films grown on MgO(100) by d.c. bias sputter deposition

✍ H. Qiu; A. Kosuge; H. Maruyama; M. Adamik; G. Safran; P.B. Barna; M. Hashimoto 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 322 KB

Structures and Physical Properties of Fi

Structures and Physical Properties of Films Deposited by Simultaneous DC Sputtering of ZnO and In2O3 or ITO Targets

✍ Toshihiro Moriga; Takashi Okamoto; Kazunori Hiruta; Azumi Fujiwara; Ichiro Nakab 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 369 KB

Oxide 5lms in the ZnO+In 2 O 3 and ZnO+tin-doped indium oxide (ITO) systems were deposited by simultaneous dc sputtering of ZnO and In 2 O 3 or ITO facing targets at substrate temperatures from room temperature up to 3003C. The ratio of the ZnO target current to the sum of both the currents was vari

Effects of deposition temperatures on st

Effects of deposition temperatures on structure and physical properties of Cd1−xZnxTe films prepared by RF magnetron sputtering

✍ Dongmei Zeng; Wanqi Jie; Hai Zhou; Yingge Yang 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 453 KB

Morphology, structure, and electrical pr

Morphology, structure, and electrical properties of YBa2Cu3Ox thin films on tilted NdGaO3 substrates, deposited by DC-sputtering

✍ Peter B. Mozhaev; Iosif M. Kotelyanskii; Valery A. Luzanov; Julia E. Mozhaeva; T 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 273 KB

Thin YBa 2 Cu 3 O x (YBCO) films were deposited using DC-sputtering technique on NdGaO 3 substrates, tilted from (1 1 0) orientation by 0-26°. The structure and surface quality of the substrates were carefully characterized to obtain reliable results of thin films deposition. Structural, morphologic