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Structural and optical properties of thin zirconium oxide films prepared by reactive direct current magnetron sputtering

✍ Scribed by Venkataraj, S.; Kappertz, Oliver; Weis, Hansjörg; Drese, Robert; Jayavel, R.; Wuttig, Matthias


Book ID
120005598
Publisher
American Institute of Physics
Year
2002
Tongue
English
Weight
469 KB
Volume
92
Category
Article
ISSN
0021-8979

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Thin films of ZrO 2 were prepared by reactive magnetron sputtering. Annealing of the films exhibited a drastic change in the properties due to improved crystallinity and packing density. The root mean square roughness of the sample observed from atomic force microscope is about 5.75 nm which is comp