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Structural and optical characterization of SiO2 under irradiation with swift heavy ions

โœ Scribed by Yin, Song; Chong-hong, Zhang; Yan-cheng, Men; Heng-qing, Zhang; Li-qing, Zang; Jie, Gou; Yi-tao, Yang; Yi-zhun, Ma


Book ID
122288505
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
665 KB
Volume
326
Category
Article
ISSN
0168-583X

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Thermally grown amorphous SiO 2 samples were implanted at room temperature (RT) with 120 keV C-ions to a dose ranging from 1.0 โ€ข 10 16 to 8.6 โ€ข 10 17 C ions/cm 2 , then irradiated at RT with 950 MeV Pb, 345 or 1754 MeV Xe ions to a fluence in the region from 1.0 โ€ข 10 11 to 3.8 โ€ข 10 12 ions/cm 2 , re