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Structural and optical characterization of highly Er and Eu doped GaN layers grown by MBE

✍ Scribed by T. Wojtowicz; P. Ruterana; N. Rouseau; G. Halambalakis; O. Briot; V. Katchkanov; S. Dalmasso; R. W. Martin; K. P. O'Donnell

Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 216 KB
Volume: 1
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200405072

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