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Structural and optical absorption studies on polycrystalline AgGa0.5In0.5Te2 thin films

✍ Scribed by El-Sayad, E. A.

Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
187 KB
Volume
201
Category
Article
ISSN
0031-8965

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The structural, electrical and optical properties of AgGa(Se 0.5 S 0.5 ) 2 thin films deposited by using the thermal evaporation method have been investigated as a function of annealing in the temperature range of 450-600 Β°C. X-ray diffraction (XRD) analysis showed that the structural transformation