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Structural and electrical characteristics of copper indium disulfide thin film

✍ Scribed by G.C. Park; Y.T. Yoo; J. Lee

Book ID
116136424
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
165 KB
Volume
71
Category
Article
ISSN
0379-6779

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πŸ“œ SIMILAR VOLUMES

Optical and structural characterization
Optical and structural characterization of copper indium disulfide thin films
✍ D.O. Henderson; R. Mu; A. Ueda; M.H. Wu; E.M. Gordon; Y.S. Tung; M. Huang; J. Ke πŸ“‚ Article πŸ“… 2001 πŸ› Elsevier Science βš– 410 KB

## Ε½ . Thin films of copper indium disulfide CuInS were synthesized by spray chemical vapor deposition. Rutherford backscattering 2 measurements were used to determine the composition and thickness of the films. The elemental ratios were found to be within 2% of stoichiometrically correct CuInS .