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Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction

✍ Scribed by Krunoslav Juraić; Davor Gracin; Igor Djerdj; Andrea Lausi; Miran Čeh; Davor Balzar


Book ID
113823540
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
958 KB
Volume
284
Category
Article
ISSN
0168-583X

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