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Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction

✍ Scribed by Krunoslav Juraić; Davor Gracin; Igor Djerdj; Andrea Lausi; Miran Čeh; Davor Balzar

Book ID: 113823540
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 958 KB
Volume: 284
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2011.07.018

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