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Stress relaxation in AlCu thin films

✍ Scribed by C.J. Shute; J.B. Cohen


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
612 KB
Volume
149
Category
Article
ISSN
0921-5093

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Stress relaxation in Al(Cu) thin films
✍ J. Proost; A. Witvrouw; P. Cosemans; Ph. Roussel; K. Maex 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 529 KB

Substrate curvature measurements were used to study both the stress changes during thermal cycling and the kinetics of tensile stress relaxation in 800 nm A1 (0.5wt% Cu)-fiims on oxidized Si-substrates. Qualitative microstructural evidence is provided for the observed decrease in room-temperature st