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Stress measurements in polycrystalline silicon films grown by hot-wire chemical vapor deposition

✍ Scribed by D. Peiró; J. Bertomeu; F. Arrando; J. Andreu


Book ID
117358099
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
423 KB
Volume
30
Category
Article
ISSN
0167-577X

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