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Stress-induced defects in Sb2Te3

✍ Scribed by Thonhauser, T.; Jeon, Gun; Mahan, G.; Sofo, J.

Book ID: 111869419
Publisher: The American Physical Society
Year: 2003
Tongue: English
Weight: 236 KB
Volume: 68
Category: Article
ISSN: 1098-0121
DOI: 10.1103/physrevb.68.205207

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